Search

Now showing items 1-10 of 44

Capacitance-voltage measurements of hetero-layer OLEDs treated by an electric field and thermal annealing

Al-Qrinawi, Mohammed S.; El-Agez, Taher M.; Abdel-Latif, Monzir S.; Taya, Sofyan A. (Natural Sciences publishing, 2021)

"Abstract: Capacitance-voltage (C-V) characterization of organic light-emitting diodes (OLEDs) having the structure ITO/ PVK (poly (9-Vinylcarbazole)/Rhodamine B dye/Pb is reported. The C-V curves provide more understanding ...

The Influence of Thin Layer Copper Phthalocyanine on the Performance of PVK/ Rhodamine B Device

Abdel-Latif, Monzir S.; Taya, Sofyan A.; El-Agez, Taher M.; Al-Qrinawi, Mohammed S. (الجامعة الإسلامية - غزة, 2016)

In this paper, the influence of copper-phthalocyanine (CuPc) hole-injection layer on the current voltage characteristic and the electroluminescence performance of ITO/CuPc/PVK/ Rhodamine B/Pb devices was investigated. The ...

Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1

Alkanoo, Anas A; El-Agez, Taher M.; Taya, Sofyan A.; Afghjani, Ahed (2016)

A homemade spectroscopic ellipsometer is designed indigenously to characterize Si-SiO2 sample and two Poly (9-vinylcarbazole)(PVK) films. In the constructed ellipsometer, the polarizer and analyzer rotate in the same ...

Research Article Characterization of PVK Polymeric Material Using Rotating Polarizer and Analyzer Ellipsometer with a Speed Ratio 1: 1 Anas A. Alkanoo Department of Physics …

El-Agez, Taher M.; Taya, Sofyan A.; Afghjani, Ahed (2016)

A homemade spectroscopic ellipsometer is designed indigenously to characterize Si-SiO 2 sample and two Poly (9-vinylcarbazole)(PVK) films. In the constructed ellipsometer, the polarizer and analyzer rotate in the same ...

Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1: 1

Alkanoo, Anas A; Taya, Sofyan A.; El-Agez, Taher M. (Springer US, 2015)

In a recent work, rotating polarizer compensator ellipsometer (RPCE) with a fixed analyzer was proposed. Three different ellipsometric configurations were presented by considering different speed ratios of the rotating ...

Dye-sensitized solar cells using dyes extracted from flowers, leaves, parks, and roots of three trees

Abdel-Latif, Monzir S.; Abuiriban, Mahmoud B; El-Agez, Taher M.; Taya, Sofyan A. (2015)

In this paper, eleven natural dyes were collected from three trees and used as photosensitizers for dye sensitized solar cells (DSSCs). The cells were fabricated using TiO2 as a semiconducting layer deposited on transparent ...

Electrical properties of organic light emitting diodes with post fabrication heat and electric field treatments

El-Agez, Taher M.; Al-Qrinawi, Mohammed S.; Abdel-Latif, Monzir S.; Taya, Sofyan A. (Center for Exchange Knowledge, 2015)

The current work presents post-fabrication heat treatment and a combined external electric field-heat post-fabrication treatments for organic light emitting diodes (OLEDs). The devices were fabricated in the same run with ...

Aldimine derivatives as photosensitizers for dye-sensitized solar cells

Batniji, Amal Y.; Morjan, Rami Y.; Abdel-Latif, Monzir S.; El-Agez, Taher M.; Taya, Sofyan A.; El-Ghamri, Hatem S (2014-01-17)

Five aldimine derivatives were prepared by condensation of the appropriate amine with salicylaldehyde (m1-m4) and 4-aminobenzoic acid with 2-thiophene carboxaldehyde (m5). A molar ratio of 1: 1 was used and the mixture was ...

Design of a spectroscopic ellipsometer by synchronous rotation of the polarizer and analyzer in opposite directions

El-Agez, Taher M.; Taya, Sofyan A. (2014)

In this article, a spectroscopic ellipsometer is constructed in rotating polarizer and analyzer configuration. Instead of continuous rotation and integration for waveform analysis, a step and scan method was adopted for ...

A spectroscopic ellipsometer using rotating polarizer and analyzer at a speed ratio 1: 1 and a compensator

Taya, Sofyan A.; El-Agez, Taher M.; Alkanoo, Anas A (Springer US, 2014)

Ellipsometers have been widely used in thin film characterization. They have shown a high degree of accuracy. We here propose theoretically a rotating polarizer and analyzer ellipsometer at a speed ratio 1:1 with a fixed ...

1
2
3
4
. . .
5