Transfer matrix method application on semiconductor-based solar cell characteristics measurements

Abstract

In this work, numerical calculations and simulation based on Transfer Matrix Method have been presented to investigate a model solar cell structure. New four-layered structure containing different types of semiconductor has been presented, analyzed and discussed. The average reflectance and average transmittance in the visible light are derived and plotted versus the operating wavelength at different physical parameters. The obtained results show that the proposed structure is a promising candidate to be used for designing future solar cell structures.