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|Title||Development and construction of rotating polarizer analyzer ellipsometer|
A detailed mathematical derivation and an experimental characterization of one to two ratio rotating polarizer analyzer ellipsometer (RPAE) are presented. The alignment, calibration, and testing of reference samples are also discussed. The optical properties of some known materials obtained by the proposed ellipsometer will be shown and compared to accepted values. Moreover, the constructed ellipsometer will be tested using two ellipsometry standards with different thicknesses.
|Published in||Optics and lasers in engineering|
|Series||Volume: 49, Number: 4|
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