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|Title||Design of nonlinear optical waveguide sensors with metallic cores by uniform field profile approach|
TE waves can propagate in metal film of three waveguide structure if at least one of the covering media is nonlinear. The waveguide sensor under consideration consists of a metal wave guiding film coated with two nonlinear claddings. Contrary to what has been recently predicted, it is shown here that uniform field profile may be achieved under the suitable choice of the dielectric constants of the surroundings. Electric fields and fraction of power flow down the sensor layers are studied here. We expect this kind of planar waveguide sensors may be realized experimentally and will have applications in future opto-electronic devices. Uniform field approach has been discussed and implemented for the first time in investigating the waveguide sensors.
|Published in||Optical Sensing Technology and Applications|
|Publisher||International Society for Optics and Photonics|
|Item link||Item Link|
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