Theoretical investigation of five-layer waveguide structure including two left-handed material layers for refractometric applications

Abstract

A slab waveguide structure consisting of five layers is studied for optical sensing applications. The five-layer waveguide structure has a guiding dielectric film, two left-handed material (LHM) layers and two dielectric layers as a substrate and a cladding. The dispersion relation and the sensitivity to any change in the index of the analyte layer are derived. The sensitivity is explored with different parameters of the structure. It is found that the sensitivity of the proposed structure can be significantly improved with the increase of the index of the guiding layer and the decrease of the permittivity of the LHM layers. Moreover, it can be also improved with the increase of the thickness of the LHM layers.