Binary photonic crystal for refractometric applications (TE case)

Abstract

In this work, a binary photonic crystal is proposed as a refractometric sensor. The dispersion relation and the sensitivity are derived for transverse electric (TE) mode. In our analysis, the first layer is considered to be the analyte layer and the second layer is assumed to be left-handed material (LHM), dielectric or metal. It is found that the sensitivity of the LHM structure is the highest among other structures. It is possible for LHM photonic crystal to achieve a sensitivity improvement of 412% compared to conventional slab waveguide sensor.