Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12358/25773
Title | Characterization of SiO2 thin film using rotating polarizer analyzer ellipsometer |
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Authors | |
Type | Journal Article |
Date | 2011 |
Published in | Int. J. Microwave Opt. Techn.(IJMOT) |
Series | Volume: 6 |
Citation | |
Item link | Item Link |
License | ![]() |
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