Characterization of SiO2 thin film using rotating polarizer analyzer ellipsometer

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http://hdl.handle.net/20.500.12358/25773

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Title	Characterization of SiO2 thin film using rotating polarizer analyzer ellipsometer
Authors	El-Agez, Taher M. Taya, Sofyan A.
Type	Journal Article
Date	2011
Published in	Int. J. Microwave Opt. Techn.(IJMOT)
Series	Volume: 6
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Collections	Staff Publications- Faculty of Science [904]

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