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|Title||Thermal – Stress Effects on TE Nonlinear Waveguide Sensors|
In recent years, waveguide sensors in dielectric films have received more attention. Many theoretical studies concerning analysis of dispersion equations were introduced for many planar waveguide structures for both linear and nonlinear media. In this work, the TE electromagnetic waves in a three- layer waveguide sensors is studied. The waveguide structure is linear dielectric film bounded by two nonlinear cladding and substrate. The dispersion relation of the electromagnetic field in the proposed structure has been derived. Numerical calculations are carried out. Consequently; effect of stress and thermal- stress on the core of the structure has been studied. Temperature sensitivity is also measured. These results were simulated and presented in graphical form using software program called Maple V.
|Publisher||the islamic university|
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