Browsing by Subject "c-si"
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Thin film characterization using rotating polarizer analyzer ellipsometer with a speed ratio 1: 3
(Scientific Research Publishing, Inc,, 2011)In a recent previous work, we proposed a rotating polarizer-analyzer ellipsometer (RPAE) in which the two elements are rotating synchronously in the same direction with a speed ratio 1: 3. We applied this technique to bulk ...