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TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films
Nyenge, R. L.; Shaat, Samy K.; Noto, L.L.; Mokoena, P. P.; Swart, Hendrik C; Ntwaeaborwa, Odireleng M. (Elsevier BV, 2015-11)CaS:Eu2þ thin films weredepositedonSi(100)substratesusingthepulsedlaserdepositiontechniqueto investigatetheeffectofargon(Ar),oxygen(O2), andvacuumdepositionatmospheresonthestructural, morphological andphotoluminescence ...